On-Chip Monitoring of Time-Dependent Dielectric Breakdown (TDDB) using a Novel Leakage Current Sensor with Digital Output

Darko, Emmanuel Nti; Bhatheja, Kushagra; Adjei, Daniel; Strong, Matthew; Chen, Degang

doi:10.1109/iirw59383.2023.10477703

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2024

Publication Types

Select...

Other1

Article1

Relationship

Self Cite0

Independent2

Authors

Journals

Cited by 2 publications

References 17 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs

Karimpour,

Bruce,

Sekyere

et al. 2024

2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS)

View full text Add to dashboard Cite

A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs

Karimpour,

Bruce,

Sekyere

et al. 2024

2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS)

View full text Add to dashboard Cite

Direct Current to Digital Converter (DIDC): A Current Sensor

Karimpour,

Sekyere,

Bruce

et al. 2024

Sensors

View full text Add to dashboard Cite

This paper introduces a systematic approach to the design of Direct Current-to-Digital Converter (DIDC) specifically engineered to overcome the limitations of traditional current measurement methodologies in System-on-Chip (SoC) designs. The proposed DIDC addresses critical challenges such as high power consumption, large area requirements, and the need for intermediate analog signals. By incorporating a current mirror in a cascode topology and managing the current across multiple binary-sized branches with the Successive Approximation Register (SAR) logic, the design achieves precise current measurement. A simple comparator, coupled with an isolation circuit, ensures accurate and reliable sensing. Fabricated using the TSMC 180 nm process, the DIDC achieves 8-bit precision without the need for nonlinearity calibration, showcasing remarkable energy efficiency with an energy per conversion of 1.52 pJ, power consumption of 117 µW, and a compact area of 0.016 mm². This innovative approach not only reduces power consumption and area, but also provides a scalable and efficient solution for next-generation semiconductor technologies. The ability to conduct online measurements during both standard operations and in-field conditions significantly enhances the performance and reliability of SoCs, making this DIDC a promising advancement in the field.

show abstract

On-Chip Monitoring of Time-Dependent Dielectric Breakdown (TDDB) using a Novel Leakage Current Sensor with Digital Output

Cited by 2 publications

References 17 publications

A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs

A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs

Direct Current to Digital Converter (DIDC): A Current Sensor

Contact Info

Product

Resources

About