2015
DOI: 10.1039/c5lc00794a
|View full text |Cite
|
Sign up to set email alerts
|

On-chip phase measurement for microparticles trapped on a waveguide

Abstract: Polystyrene microparticles are trapped on a waveguide Young interferometer and the phase change caused by the trapped particles is measured. This is a novel, on-chip method that can be used to count and characterize trapped particles. The trapping of single particles is clearly identified. Simulations show that the phase change increases with the diameter up to 7 μm, while for larger particles, morphology-dependent resonances appear. For 7 μm particles, a phase change of -0.13 rad is measured, while the simula… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2016
2016
2020
2020

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 8 publications
(1 citation statement)
references
References 25 publications
0
1
0
Order By: Relevance
“…The chip-based platform also supports different on-chip optical modalities such as Raman spectroscopy on chip [22], on-chip micro-particle manipulation [23], interferometric microparticle sensing [24] and gas sensing [25], where several of these techniques can be combined creating advanced lab-on-a-chip multimodality platforms. In this work, we have investigated the relationship between waveguide widths and some parameters related to extending the FOV in super-resolution microscopy imaging.…”
Section: Discussionmentioning
confidence: 99%
“…The chip-based platform also supports different on-chip optical modalities such as Raman spectroscopy on chip [22], on-chip micro-particle manipulation [23], interferometric microparticle sensing [24] and gas sensing [25], where several of these techniques can be combined creating advanced lab-on-a-chip multimodality platforms. In this work, we have investigated the relationship between waveguide widths and some parameters related to extending the FOV in super-resolution microscopy imaging.…”
Section: Discussionmentioning
confidence: 99%