On Error Probability and Computational Complexity of Pattern Recognition in a Metric Space of the Tree-Structured Representations

Lange, M. M.; Paramonov, Semion

doi:10.3103/s8756699022050077

Optoelectron.Instrument.Proc.

2022

DOI: 10.3103/s8756699022050077

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On Error Probability and Computational Complexity of Pattern Recognition in a Metric Space of the Tree-Structured Representations

M. M. Lange

Semion Paramonov²

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On Error Probability and Computational Complexity of Pattern Recognition in a Metric Space of the Tree-Structured Representations

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