A comparative study of DC, RF and VHF excitation for the plasma enhanced chemical vapor deposition (PECVD) of intrinsic layers of a-Si:H is presented, with special emphasis on the effects of hydrogen dilution. Growth rates at comparable plasma power, for substrate temperatures between 100°C and 300°C and for various H 2 dilution ratios are presented, along with optical bandgap, H content, and electronic transport properties in the light-soaked state.H 2 strongly reduces the growth rate for all techniques. The growth rate for the highest H 2 dilution ratio is approximately four times higher for VHF than for DC or RF excitation. In all three cases increasing the substrate temperature reduces the optical gap and the H content C H . Raising the substrate temperature slightly enhances the stability of undiluted films. H 2 dilution increases the optical gap for all three techniques. The H content of RF-and VHF-deposited samples increases with increasing H 2 dilution ratio, while in DC deposition it produces an initial drop of the H content, followed by an increase. In all three cases, H 2 dilution improves the electronic transport properties of the material by roughly a factor of two. The gain in stability is most pronounced for relatively small dilution; in the case of DC deposition, too strong a dilution even has an adverse effect on stability.