On-line automatic high speed inspection of cartridge cases

Coleman, William J.; Reich, F.R.; Erickson,; Kelly, W.S.

doi:10.2172/4272487

Cited by 2 publications

(1 citation statement)

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“…The initial system described in earlier publications was installed at the Twin City Army Ammunition Plant located in the Minneapolis, Minnesota area. (1,2,3) This paper describes the advanced system and provides information on the individual measurement techniques.…”

Section: Introductionmentioning

confidence: 99%

<title>Automatic Cartridge Case Inspection And Process Control Monitor</title>

Coleman¹,

Swinth²

1977

SPIE Proceedings

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Battelle, Pacific Northwest Laboratories has developed an advanced cartridge case measurement /eject system (CCMES) which automatically inspects and rejects cases at up to 1200 per minute. The system consists of a mechanical handler, measurement instruments, and a dedicated computer. System operation is monitored and controlled while the product is being measured. Five case dimensions are measured by an electro-optical system using diode arrays to measure a case image at unity magnification.By scan averaging, measurement standard deviations as small as 2.5 microns are obtained at a throughput of 1200 cases per minute.Measurements made with the system fall within the uncertainties of hand -gauged values for the same cases. Four zones on each case are examined for surface flaws, such as dents and scratches, by detecting light scattered from the surface.The system can detect these surface flaws at inspection rates of 1200 cases per minute.Using electro -optic methods, two additional measuring stations detect vent hole presence and gross size deviations to prevent mechanical jams. A third station employs an eddy current technique to detect splits and folds in critical regions of the cartridge.The overall system has passed quality assurance tests administered by the sponsor and will soon be installed at the Lake City Army Ammunition Plant. AbstractBattelle, Pacific Northwest Laboratories has developed an advanced cartridge case measurement/eject system (CCMES) which automatically inspects and rejects cases at up to 1200 per minute. The system consists of a mechanical handler, measurement instruments, and a dedicated computer. System operation is monitored and controlled while the product is being measured. Five case dimensions are measured by an electro-optical system using diode arrays to measure a case image at unity magnification. By scan averaging, measurement standard deviations as small as 2.5 microns are obtained at a throughput of 1200 cases per minute. Measurements made with the system fall within the uncertainties of hand-gauged values for the same cases. Four zones on each case are examined for surface flaws, such as dents and scratches, by detecting light scattered from the surface. The system can detect these surface flaws at inspection rates of 1200 cases per minute. Using electro-optic methods, two additional measuring stations detect vent hole presence and gross size deviations to prevent mechanical jams. A third station employs an eddy current technique to detect splits and folds in critical regions of the cartridge. The overall system has passed quality assurance tests administered by the sponsor and will soon be installed at the Lake City Army Ammunition Plant.

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Section: Introductionmentioning

confidence: 99%

<title>Automatic Cartridge Case Inspection And Process Control Monitor</title>

Coleman¹,

Swinth²

1977

SPIE Proceedings

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High-Speed Surface Flaw Inspection

Reich

Coleman

1976

Opt. Eng

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An optical surface flaw inspection monitor has been developed as a part of Frankford Arsenal's Cartridge Case Measurement Eject System for 5.56 mm small -caliber ammunition. This surface flaw monitor uses scattered light electro-optical instrumentation to detect flaw presence on 100% of the cartridge case surface at case throughput rates exceeding 1200 cases /minute. A line source formed from a laser source with cylindrical optics automatically tracks a spinning cartridge on the perimeter of a wheel -type mechanical handling system. Individual fiber optic elements located at each case position direct scattered light from surface zones of the case to common photomultiplier -based optical detectors. The detected signals are corrected for illumination and receiving optics transmissions and then frequency -processed. The frequency pattern of the detected scattered light relates directly to the type of surface flaw, such as dents and scratches. Go /no -go signals are fed directly to a minicomputer for implementation of a reject function on the mechanical handling hardware.

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On-line automatic high speed inspection of cartridge cases

Cited by 2 publications

References 0 publications

<title>Automatic Cartridge Case Inspection And Process Control Monitor</title>

<title>Automatic Cartridge Case Inspection And Process Control Monitor</title>

High-Speed Surface Flaw Inspection

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