2004
DOI: 10.7498/aps.53.728
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On micro scanning forces under the coupling deformation of atomic force microscope probe

Abstract: Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process. Numerical simulations of micro scanning forces and micro topography are presented to investigate the influence of the coupling deformation of AFM probe under the AFM contact mode. It is demonstrated that the normal scan force is actually not constant, which is coupled with the lateral force on an asperity of sample surface, increasing togeth… Show more

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