2010 27th International Conference on Microelectronics Proceedings 2010
DOI: 10.1109/miel.2010.5490452
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On randomness and reliability of electronic devices: A case-study of thick dielectrics

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Cited by 1 publication
(3 citation statements)
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“…1a. The key challenge of understanding electrical conduction through network of CNT or SiNW is that the conduction cannot be described by ohm's law, but rather must be understood in terms of a heterogeneous, nonlinear, percolation model (8,19,21,22,23). Percolation theory accounts for the fact that for the networked channel in Fig.…”
Section: Electrical Properties Of Nanonet Fabrics For Application In ...mentioning
confidence: 99%
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“…1a. The key challenge of understanding electrical conduction through network of CNT or SiNW is that the conduction cannot be described by ohm's law, but rather must be understood in terms of a heterogeneous, nonlinear, percolation model (8,19,21,22,23). Percolation theory accounts for the fact that for the networked channel in Fig.…”
Section: Electrical Properties Of Nanonet Fabrics For Application In ...mentioning
confidence: 99%
“…For further details of these ideas and application to modern TFTs, we refer the reader to the NCN/Intel lecture series posted at Ref. (8).…”
Section: Electrical Properties Of Nanonet Fabrics For Application In ...mentioning
confidence: 99%
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