On-state resistance degradation of power RF N-LDMOS devices due to defects created at interface

Belaïd, Mohamed Ali; Almusallam, Ahmed

doi:10.1109/iccis49240.2020.9257695

2020 2nd International Conference on Computer and Information Sciences (ICCIS) 2020

DOI: 10.1109/iccis49240.2020.9257695

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On-state resistance degradation of power RF N-LDMOS devices due to defects created at interface

Mohamed Ali Belaïd

Ahmed Almusallam

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On-state resistance degradation of power RF N-LDMOS devices due to defects created at interface

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References 15 publications

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