On Test Pattern Generation Method for an Approximate Multiplier Considering Acceptable Faults

Tokai, Shogo; Akamatsu, Daichi; Yotsuyanagi, Hiroyuki; Hashizume, Masaki

doi:10.1109/itc-asia58802.2023.10301158

2023 IEEE International Test Conference in Asia (ITC-Asia) 2023

DOI: 10.1109/itc-asia58802.2023.10301158

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On Test Pattern Generation Method for an Approximate Multiplier Considering Acceptable Faults

Shogo Tokai,

Daichi Akamatsu,

Hiroyuki Yotsuyanagi

et al.

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On Test Pattern Generation Method for an Approximate Multiplier Considering Acceptable Faults

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References 16 publications

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