On the analysis of grain size in bulk nanocrystalline materials via x-ray diffraction

Zhang, Z.; Zhou, Fei; Lavernia, Enrique J.

doi:10.1007/s11661-003-0246-2

Cited by 234 publications

(144 citation statements)

References 17 publications

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“…Line profile fitting with a pseudo-Voigt function, i.e., a superposition of a Lorentz and a Gauss function, revealed that all recorded XRD line profiles were purely Lorentzian in shape. It is well accepted that Lorentzian broadening of XRD line profiles is related to the size of the coherently diffracting domains, 18,19 which can be considered to be the size of grains or subgrains, 20 i.e., the crystallite size. From the integral breadth ␤ L , which was obtained from the FWHM and corrected for instrumental broadening, the crystallite size D was calculated according to 17,18 …”

Section: B Xrd Line Profile Analysismentioning

confidence: 99%

In situ investigation of the microstructure evolution in nanocrystalline copper electrodeposits at room temperature

Pantleon

Somers

2006

Journal of Applied Physics

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The microstructure evolution in copper electrodeposits at room temperature ͑self-annealing͒ was investigated by means of x-ray diffraction analysis and simultaneous measurements of the electrical resistivity as a function of time. In situ studies were started immediately after deposition of the various thick layers and continued with a unique time resolution until stabilization of the recorded data occurred. Independent of the copper layer thickness, the as-deposited microstructure consisted of nanocrystalline grains with orientation dependent crystallite sizes. Orientation dependent grain growth, crystallographic texture changes by multiple twinning, and a decrease of the electrical resistivity occurred as a function of time at room temperature. The kinetics of self-annealing is strongly affected by the layer thickness: the thinner the layer, the slower the microstructure evolution is, and self-annealing is suppressed completely for a thin layer with 0.4 m. The preferred crystallographic orientation of the as-deposited crystallites is suggested to cause the observed thickness dependence of the self-annealing kinetics.

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Section: B Xrd Line Profile Analysismentioning

confidence: 99%

In situ investigation of the microstructure evolution in nanocrystalline copper electrodeposits at room temperature

Pantleon

Somers

2006

Journal of Applied Physics

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“…It has been hypothesized that the lower sharp peaks or peak broadening (Zhang et al, 2003) perpendicular to the c-axes (Hanschin & Stern, 1995) in the µXRD 2 indicated that sound dentin became more amorphous (Moshaverinia et al, 2008) or with more crystals imperfections in nanocrystallite materials, i.e, small crystallite size and lattice distortion (Zhang et al, 2003) than caries-affected dentin. In addition, sound dentin (Figs.…”

Section: Resultsmentioning

confidence: 99%

“…At (310) reflections this decrease was ~1.21 fold bigger. Grain size and lattice microstrain accordingly can be determined by measuring the deviation of line profile from perfect crystal diffraction (Zhang et al, 2003).…”

Section: Resultsmentioning

confidence: 99%

“…Thus, any fracture or strong discontinuity in the mechanical properties at the microscopic level of the restoration, restorative interface of dental substrate would definitely have consequences in the overall function that takes place at the macroscopic level (centimeter length scale). The dependence of crystallite sizes on crystallographic orientation may arise from the fact that crystallites of the bulk may not be completely random oriented; as a result, the dimension variation in the crystallographic orientation may imply that the grains are not quite equiaxed; furthermore, the presence of texture may have contributed to the larger difference of the grain sizes among the two reflections (Zhang et al, 2003). Therefore, from the results described above, it appears that the degree of crystal disorder in HAp may be related to its crystal size.…”

Section: Resultsmentioning

confidence: 99%

“…First, Scherrer equation to calculate the crystallite size (Perales et al, 2008;Zhang et al, 2003;Xue et al, 2013), was used:…”

Section: X-ray Diffraction (Xrd) Analysismentioning

confidence: 99%

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Zinc-Containing Restorations Create Amorphous Biogenic Apatite at the Carious Dentin Interface: A X-Ray Diffraction (XRD) Crystal Lattice Analysis

et al. 2016

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The aim of this research was to assess the ability of amalgam restorations to induce amorphous mineral precipitation at the caries-affected-dentin substrate. Sound and cariesaffected dentin surfaces were subjected to both Zn-free and Zn-containing dental amalgam restorations. Specimens were submitted to thermocycling (100,000cy/5 ºC-55 ºC, 3 months).Dentin surfaces were studied by atomic force microscopy (AFM/nano-roughness), X-ray diffraction (XRD 2 ), field emission electron microscopy (FESEM) and energy-dispersive analysis (EDX), for physical and morphological surface characterization. Zn-containing amalgam placement reduced crystallinity, crystallite size and grain size of calcium phosphate crystallites at the dentin surface. Both microstrain and nanoroughness augmented in cariesaffected dentin restored with Zn-containing amalgams. Caries-affected dentin showed the shortest mineral crystallites (11.04 nm), when Zn-containing amalgams were used for restorations, probably leading to a decrease of mechanical properties which might favor crack propagation and deformation. Sound dentin restored with Zn-free amalgams exhibited a substantial increase in length of grain particles (12.44 nm) embedded into dentin crystallites.Zn-containing amalgam placement creates dentin mineralization and the resultant mineral was, utterly, amorphous in nature. Amorphous calcium phosphate will provide a local ion-rich environment which is considered favorable for in situ generation of prenucleation clusters, succeeding further dentin remineralization.

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Solute Distribution and Mechanical Properties of Ultra‐Fine‐Grained Al‐Mg Alloys

Karnesky¹,

Yang²,

Marchi³

et al. 2012

ICAA13: 13th International Conference on Aluminum Alloys

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On the analysis of grain size in bulk nanocrystalline materials via x-ray diffraction

Cited by 234 publications

References 17 publications

In situ investigation of the microstructure evolution in nanocrystalline copper electrodeposits at room temperature

In situ investigation of the microstructure evolution in nanocrystalline copper electrodeposits at room temperature

Zinc-Containing Restorations Create Amorphous Biogenic Apatite at the Carious Dentin Interface: A X-Ray Diffraction (XRD) Crystal Lattice Analysis

Solute Distribution and Mechanical Properties of Ultra‐Fine‐Grained Al‐Mg Alloys

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