2022
DOI: 10.1002/pip.3545
|View full text |Cite
|
Sign up to set email alerts
|

On the chances and challenges of combining electron‐collecting nPOLO and hole‐collecting Al‐p+ contacts in highly efficient p‐type c‐Si solar cells

Abstract: ISFH is following a distinct cell development roadmap, which comprises-as a shortterm concept-the combination of an n-type doped electron-collecting poly-Si on oxide (POLO) junction with an Al-alloyed p + junction for hole collection. This combination can be integrated either in front-and back-contacted back junction cells (POLO-BJ) or in interdigitated back-contacted cells (POLO-IBC). Here, we present recent progress with these two cell concepts. We report on a certified M2-sized 22.9% efficient POLO-BJ cell … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

2
13
0

Year Published

2022
2022
2023
2023

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 13 publications
(15 citation statements)
references
References 62 publications
2
13
0
Order By: Relevance
“…This value is close to 23.7% measured on small cells with DARC. [22] The V oc of our best M2-sized cell with DARC is 711 mV and thus almost the same as the 711.5 mV of our best 4 cm 2 -sized cell. The J sc values are also similar: 41.1 mA cm À2 for M2-sized cells and 41.3 mA cm À2 for 4 cm 2 -sized cells.…”
Section: Discussionsupporting
confidence: 66%
See 3 more Smart Citations
“…This value is close to 23.7% measured on small cells with DARC. [22] The V oc of our best M2-sized cell with DARC is 711 mV and thus almost the same as the 711.5 mV of our best 4 cm 2 -sized cell. The J sc values are also similar: 41.1 mA cm À2 for M2-sized cells and 41.3 mA cm À2 for 4 cm 2 -sized cells.…”
Section: Discussionsupporting
confidence: 66%
“…We achieved an energy conversion efficiency of 23.7%, as independently confirmed by ISFH CalTeC. [ 22 ]…”
Section: Introductionsupporting
confidence: 53%
See 2 more Smart Citations
“…Besides, being most compatible with c ‐Si, the SiO 2 interlayer is often used to improve the passivation quality by saturating the dangling bonds and suppressing the element diffusion. In this case, the carriers are believed to pass through the ultra‐thin SiO 2 passivation layer through tunneling and pinholes 188–190 . Attention should be paid to distinguishing SiO 2 passivation layers that are intentionally formed (e.g., by UV/O 3 treatment, chemical and thermal oxide growth, etc.)…”
Section: Performance Optimization Of Dopant‐free Passivating Contact ...mentioning
confidence: 99%