2007
DOI: 10.1038/nphoton.2007.68b
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On the concept of imaging nanoscale vector fields

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Cited by 7 publications
(6 citation statements)
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“…It has been reported that a circularly apertured fiber tip collects the in-plane electric field component E x perpendicular to the slit axis and magnetic field H y along the slit axis with approximately the same efficiency. [26,30,31] We therefore assumed an equal coupling ratio for E x and H y , such that the collected intensity is proportional to The transmitted near-field intensity I(x) calculated in this way is shown in Fig. 5 (top) and (bottom) as dashed red lines, together, for Δφ=0 and -π, respectively, and is in satisfactory agreement with the experimental data (black solid lines).…”
Section: Spectrum Domain Study Of Spp Generation In Nanoslit Arraysupporting
confidence: 64%
“…It has been reported that a circularly apertured fiber tip collects the in-plane electric field component E x perpendicular to the slit axis and magnetic field H y along the slit axis with approximately the same efficiency. [26,30,31] We therefore assumed an equal coupling ratio for E x and H y , such that the collected intensity is proportional to The transmitted near-field intensity I(x) calculated in this way is shown in Fig. 5 (top) and (bottom) as dashed red lines, together, for Δφ=0 and -π, respectively, and is in satisfactory agreement with the experimental data (black solid lines).…”
Section: Spectrum Domain Study Of Spp Generation In Nanoslit Arraysupporting
confidence: 64%
“…This is required for symmetry-selective probing in TERS and other nonlinear tip-enhanced processes [163][164][165] (Neacsu et al, unpublished manuscript) that rely on polarization selective and conserving light scattering. In contrast, for a Ag-particle-topped quartz AFM probe as used for probing the 520-cm −1 Raman band of Si [166], the observed Raman depolarization has been attributed to the wide cone angle of the tip [119].…”
Section: Experimental Quantification Of the Near-field Raman Enhancementmentioning
confidence: 99%
“…The highly polarized TER response observed in our experiments indicates the absence of significant near-field depolarization, for the homogeneous and slender tip geometries used. This is required for symmetry selective probing in TERS and other nonlinear tip-enhanced processes [167,168,169,170] that rely on polarization selective and conserving light scattering. In contrast, for a Ag particletopped quartz AFM probe as used for probing the 520 cm −1 Raman band of Si [171] the observed Raman depolarization has been attributed to the wide cone angle of the tip [119].…”
Section: Experimental Quantification Of the Near-field Raman Enhancementmentioning
confidence: 99%
“…A lens (focal length of 5 cm) focuses the excitation beam at the slit position to eliminate the position dependent interference between the directly transmitted light through the thin metal film and the propagating SPP at the tip position. The tip is fixed at one selected x-position at about 50 μm a w a y f r o m t h e s l i t e x i t t o d i m i n i s h u n w a n t e d backgrounds resulting from the deflected light at the tip shaft when the propagating light transmitted at the slit position touches the tip surface (Lee et al, 2007b). from the bottom side of the sample to generate SPPs propagating in ± x-direction on air-gold interface.…”
Section: Wwwintechopencommentioning
confidence: 99%
“…In addition, it is needed to study the energy transfer between the tapered glass tip and the metallic structures attached to the end of it, depending on the material and on the structural shape. From (Lee et al, 2007b). © 2007 Nature Publishing Group.…”
Section: Problems and Outlookmentioning
confidence: 99%