2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2012
DOI: 10.1109/dft.2012.6378194
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On the development of Software-Based Self-Test methods for VLIW processors

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Cited by 7 publications
(1 citation statement)
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“…Some have focused on the development of SBST techniques for certain types of processors such as DSPs, VLIW Processors, GPUs and Microcontrollers [14][15][16][17][18]. Some other researchers have tried to invent new methods for functional testing of certain modules in complex processors [19,20].…”
Section: Introductionmentioning
confidence: 99%
“…Some have focused on the development of SBST techniques for certain types of processors such as DSPs, VLIW Processors, GPUs and Microcontrollers [14][15][16][17][18]. Some other researchers have tried to invent new methods for functional testing of certain modules in complex processors [19,20].…”
Section: Introductionmentioning
confidence: 99%