On the economic design of optimal sampling plan under accelerated life test setting

Abstract

PurposeIn order to reduce avoidably lengthy duration required to test highly reliable products under usage stress, accelerated life test sampling plans (ALTSPs) are employed. This paper aims to build a decision model for obtaining optimal sampling plan under accelerated life test setting using Type-I hybrid censoring scheme for products covered under warranty.Design/methodology/approachThe primary decision model proposed in this paper determines ALTSP by minimizing the relevant costs involved. To arrive at the decision model, the Fisher information matrix for Type-I hybrid censoring scheme under accelerated life test setting is derived. The optimal solution is attained by utilizing appropriate techniques following a nonlinear constrained optimization approach. As a special case, ALTSP for Type-I censoring is obtained using the same approach. ALTSP under Type-I hybrid censoring using the variance minimization approach is also derived.FindingsOn comparing the optimal results obtained using the above mentioned approaches, it is found that the cost minimization approach does better in reducing the total cost incurred. Results also show that the proposed ALTSP model under cost function setting has considerably lower expected testing time. Interesting findings from the sensitivity analysis conducted using a newly introduced failure dataset pertaining to locomotive controls are highlighted.Originality/valueThe research introduces a model to design optimum ALTSP for Type-I hybrid censoring scheme. The practical viability of the model makes it valuable for real-life situations. The practical application of the proposed model is exemplified using a real-life case.