On the Effect of Truncation in Some or All Coordinates of a Multinormal Population

Birnbaum, Z. W.; Meyer, Paul L.

doi:10.21236/ad0007092

Cited by 23 publications

(20 citation statements)

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“…In the first generation unrelated individuals (parents) were selected by mass culling on a single phenotypic expression. To 1953 ;TnLLts, 1961) allowed the calculation of exact selection response. Hence, we have modelled the phenomenon that additive genetic variance decreases with selection and increases with positive assortative mating.…”

Section: Methodsmentioning

confidence: 99%

Assortative mating and artificial selection : a second appraisal

SMITH¹,

HAMMOND²

1987

Genet. Sel. Evol.

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Section: Methodsmentioning

confidence: 99%

Assortative mating and artificial selection : a second appraisal

SMITH¹,

HAMMOND²

1987

Genet. Sel. Evol.

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“…The specified (co)variances correspond to populations where no selection occurs and when parents are mated assortatively or randomly. Once population parameters were defined, truncated multivariate normal theory (B IRNBAUM & M EYER , 1953 ;TnLLts, 1961) allowed the calculation of exact selection response. Hence, we have modelled the phenomenon that additive genetic variance decreases with selection and increases with positive assortative mating.…”

Section: B Calculating Selection Responsementioning

confidence: 99%

Assortative mating and artificial selection: a second appraisal

Smith¹,

Hammond²

1987

Genetics Selection Evolution

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“…the formulas for the truncated multivariate normal distribution, presented in [20] and [21], can be simplified to…”

Section: Extended Clark Approximation Methodsmentioning

confidence: 99%

Incremental computation of delay fault detection probability for variation-aware test generation

Wagner

Wunderlich

2014

2014 19th IEEE European Test Symposium (ETS)

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Large process variations in recent technology nodes present a major challenge for the timing analysis of digital integrated circuits. The optimization decisions of a statistical delay test generation method must therefore rely on the probability of detecting a target delay fault with the currently chosen test vector pairs. However, the huge number of probability evaluations in practical applications creates a large computational overhead. To address this issue, this paper presents the first incremental delay fault detection probability computation algorithm in the literature, which is suitable for the inner loop of automatic test pattern generation methods. Compared to Monte Carlo simulations of NXP benchmark circuits, the new method consistently shows a very large speedup and only a small approximation error. Preprint General Copyright NoticeThis article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, re-distribution, re-selling, loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden. This is the author's "personal copy" of the final, accepted version of the paper published by IEEE. Abstract-Large process variations in recent technology nodes present a major challenge for the timing analysis of digital integrated circuits. The optimization decisions of a statistical delay test generation method must therefore rely on the probability of detecting a target delay fault with the currently chosen test vector pairs. However, the huge number of probability evaluations in practical applications creates a large computational overhead.To address this issue, this paper presents the first incremental delay fault detection probability computation algorithm in the literature, which is suitable for the inner loop of automatic test pattern generation methods. Compared to Monte Carlo simulations of NXP benchmark circuits, the new method consistently shows a very large speedup and only a small approximation error.

show abstract

On the Effect of Truncation in Some or All Coordinates of a Multinormal Population

Cited by 23 publications

References 0 publications

Assortative mating and artificial selection : a second appraisal

Assortative mating and artificial selection : a second appraisal

Assortative mating and artificial selection: a second appraisal

Incremental computation of delay fault detection probability for variation-aware test generation

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