1953
DOI: 10.1143/jpsj.8.680
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On the Electric Conductivity of Cuprous Sulfide : Experiment

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Cited by 39 publications
(25 citation statements)
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“…This phenomenon was clearly reported in Cu 2 S by Miyatani et al [101] in 1953 for the first time, and was also found within Cu 2 Se by Ema [102] in 1990.…”
Section: Concerns About Cu Migration and Materials Stabilitysupporting
confidence: 70%
“…This phenomenon was clearly reported in Cu 2 S by Miyatani et al [101] in 1953 for the first time, and was also found within Cu 2 Se by Ema [102] in 1990.…”
Section: Concerns About Cu Migration and Materials Stabilitysupporting
confidence: 70%
“…Despite the high TE performance, the liquid‐like TE materials suffer from major ion migration and the resulting metal deposition when they are exposed to an external electric field or thermal gradient. For example, Miyatani et al observed notable Cu deposition at the cathode of Cu 2 S when subjected to a strong electronic current . Dennler et al found many copper whiskers and cracks on the sample surface of Cu 2 S after 24 h current stress with a current density of 24 A cm −2 .…”
Section: Stability Issue Of Liquid‐like Te Materials Under Directionamentioning
confidence: 99%
“…Each cation vacancy in is responsible for one hole in its valence band [3,7]. It seems likely that the same refers to the substitutional solid solu tions.…”
Section: Electronic Thermoelectric Power Calculation Proceduresmentioning
confidence: 99%
“…The high temperature phase α Cu 2 S (fcc structure) has a band gap of 1.7-2.0 eV. Carrier mobility in the α phase decreases with increasing temperature as Т -3/2 , suggesting that scat tering by acoustic phonons prevails [6,7]. The hole effective mass in α Cu 2 S has variously been reported to be from 0.58m e to 2.3m e .…”
Section: Introductionmentioning
confidence: 99%