2018
DOI: 10.1016/j.surfin.2018.05.007
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On the evolution of stresses due to lattice misfit at a Ni-superalloy and YSZ interface

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Cited by 38 publications
(12 citation statements)
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“…The solid interfaces with lattice mismatches of 14 %, 31 % and 64 % are constructed to have the same lattice mismatch as Li(100)–LiF(100), Li(100)–Li 2 O(100), and Li(100)–Li 2 S(100) interfaces, respectively. These Li–SE interfaces with larger lattice mismatch of f ≥14 % form disordered Li layer at interface, while heterogenous solid interfaces with f ≤20 % are typically considered as semi‐coherent [15b] . The disordering of the Li interface layer as shown in the g ( r ) (Figure 3 b and c) and the fraction of non‐BCC Li atoms within the 1 nm interfacial Li layer (Figure 3 d) increase as the lattice mismatch increases, confirming the role of lattice mismatch in inducing the interface defect layer.…”
Section: Resultsmentioning
confidence: 99%
“…The solid interfaces with lattice mismatches of 14 %, 31 % and 64 % are constructed to have the same lattice mismatch as Li(100)–LiF(100), Li(100)–Li 2 O(100), and Li(100)–Li 2 S(100) interfaces, respectively. These Li–SE interfaces with larger lattice mismatch of f ≥14 % form disordered Li layer at interface, while heterogenous solid interfaces with f ≤20 % are typically considered as semi‐coherent [15b] . The disordering of the Li interface layer as shown in the g ( r ) (Figure 3 b and c) and the fraction of non‐BCC Li atoms within the 1 nm interfacial Li layer (Figure 3 d) increase as the lattice mismatch increases, confirming the role of lattice mismatch in inducing the interface defect layer.…”
Section: Resultsmentioning
confidence: 99%
“…To investigate the potential of the LOH process in GaN‐related technologies, we used mono‐oriented MoN film as the seeding layer to grow epitaxial GaN film “on quartz glass substrate.” The lattice mismatch between the hexagonal (001) σ‐MoN and the hexagonal (001) GaN is only +11.1% calculated through the equation, f = ( a GaN − a MoN )/ a MoN , [ 41 ] where f represents the lattice mismatch, a GaN and a MoN are, respectively, the GaN and MoN lattice parameters. As we can see from Figure a, the a GaN value is about 3.216 Å, while the a MoN is about 2.893 Å from Figure 6b.…”
Section: Resultsmentioning
confidence: 99%
“…For example, lattice strain can occur in van der Waals heterostructures due to lattice mismatch. The 2D CCAs from alloying with the components of similar crystal structures and in-plane lattice constants can bring in heterostructures and multijunction of the materials with small lattice mismatch, which lowers the interface strain in a heterostructure [57][58][59].…”
Section: Introductionmentioning
confidence: 99%