2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) 2020
DOI: 10.1109/eurosoi-ulis49407.2020.9365566
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‘On-the-fly’ measurements of CMOS inverters performance degradation under pulsed stress

A. Crespo-Yepes
1
,
R. Ramos
2
,
E. Barajas
3
et al.
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