1987
DOI: 10.1007/bf00656731
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On the reasons for the effects of dispersions of stable oxides and additions of reactive elements on the adhesion and growth-mechanisms of chromia and alumina scales-the ?sulfur effect?

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Cited by 189 publications
(39 citation statements)
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“…It has been suggested that sulfur influences scale growth, both for alumina 74 and chromia 75 . Using scanning transmission electron microscopy, Fox el al 75 have found sulfur at Cr 2 O 3 scale grain boundaries, and Lees 76 proposed that the presence of sulfur there promotes cation transport at oxide grain boundaries. Whether this is true needs to be confirmed by more studies.…”
Section: Sulfurmentioning
confidence: 99%
“…It has been suggested that sulfur influences scale growth, both for alumina 74 and chromia 75 . Using scanning transmission electron microscopy, Fox el al 75 have found sulfur at Cr 2 O 3 scale grain boundaries, and Lees 76 proposed that the presence of sulfur there promotes cation transport at oxide grain boundaries. Whether this is true needs to be confirmed by more studies.…”
Section: Sulfurmentioning
confidence: 99%
“…The segregation of indigenous sulfur impurity from an alloy to the Ah03 scale/alloy interface during high temperature oxidation is often considered the major cause that weakens the interface [1][2][3][4]' Systematic studies of the chemical changes at Ah03/alloy interfaces as a function of oxidation time have in recent years been carried out for FeCrAI [5], Fe3AI and FeAI [6,7], where the alloys normally contain about 20 ppm of sulfur. Although sulfur was found to be the major segregant at these scale/alloy interfaces, the segregation behavior, in terms of rate and amount, varied significantly with different alloys and differed from surface segregation.…”
Section: Introductionmentioning
confidence: 99%
“…9,10) S content at the interface was previously measured by Auger analysis, for example on NiAl alloy with 3-4 ppm S after 10 h of oxidation at 1 000°C was reported to be about 2 at%.…”
Section: Discussionmentioning
confidence: 97%