On the role of defects in modelling approaches for thin film gas barrier coatings on polymer substrates: I. Model development
J Franke,
R Dahlmann
Abstract:We present a method to model the gas permeation through silicon-oxide thin film coatings that are afflicted with nanoscale defects. With it, we are able to give an estimation of the diffusion coefficient in bulk by subtracting the influence of the defects. The model is based on data obtained from positron annihilation spectroscopy, which is processed to yield possible defect allocation patterns of the coatings. For a systematic evaluation of these patterns, a path through the coating is calculated and then sub… Show more
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