On the size and generation of minimal N-detection tests

Kantipudi, K.R.; Agrawal, Vishwani D.

doi:10.1109/vlsid.2006.125

Cited by 33 publications

(17 citation statements)

References 21 publications

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“…We assign an integer-valued variable t i [0, 1] to ith vector such that t i = 1 means that ith vector should be included in the minimal vector set and t i = 0 means that ith vector should be discarded. The problem of finding the minimal N -detect set then reduces to assigning values to t i 's so as to [14]:…”

Section: N-detect Test Minimization By Integer Linear Programming (Ilmentioning

confidence: 99%

“…Theorem 2 [14]: A lower bound on the size of the N -detect test set is N times the size of the largest clique in the independence graph.…”

Section: N-detect Test Minimization By Integer Linear Programming (Ilmentioning

confidence: 99%

“…Theorem 3 [14]: When the minimization is performed over an exhaustive set of vectors of a combinational circuit, any ILP solution that satisfies expressions (1) and (2) is a minimum N-detect test.…”

Section: N-detect Test Minimization By Integer Linear Programming (Ilmentioning

confidence: 99%

“…N -detect tests are of interest because they are found to be useful in improving the defect coverage [2,3,8,18,22]. Therefore, various test generation strategies have been developed [2,14,16,19,22] to derive and apply such tests. The main disadvantage of the N -detect tests is their size.…”

Section: Introductionmentioning

confidence: 99%

“…The main disadvantage of the N -detect tests is their size. Various optimization strategies based on the ideas of reverse order N -detection fault simulation [19] and integer linear programming [14] have been proposed. Basically, we must reduce the test application time by reducing the test set size.…”

Section: Introductionmentioning

confidence: 99%

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A Reduced Complexity Algorithm for Minimizing N-Detect Tests

Kantipudi

Agrawal

2007

20th International Conference on VLSI Design Held Jointly With 6th International Conference on Embedded Systems (VLSID'07)

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-We give a new recursive rounding linear programming (LP) solution to the problem of N -detect test minimzation. This is a polynomialtime solution that closely approximates the exact but NP-hard integer linear programming (ILP) solution. In ILP, a test is represented by a [0, 1] integer variable and the sum of those variables is minimized. Constraints ensure that each fault has at least N tests with non-zero variables. Traditionally, the problem has been transformed to less complex LP by treating the variables as real numbers, regarded as probabilities with which they can be rounded off to 0 or 1. This is known as the randomized rounding method. In the new method, the LP is recursively used, each time rounding the largest variable to 1 and reducing the size of the LP. The method is found to converge to a solution in just a few LP runs and the result is usually better than that of randomized rounding. Experimental results include ISCAS85 benchmarks and a set of multiplier circuits. N -detect tests for N = 1, 5 and 15 are considered. Also, a 10-vector single-detect sequence for c6288 is given.

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Section: N-detect Test Minimization By Integer Linear Programming (Ilmentioning

confidence: 99%

“…Theorem 2 [14]: A lower bound on the size of the N -detect test set is N times the size of the largest clique in the independence graph.…”

Section: N-detect Test Minimization By Integer Linear Programming (Ilmentioning

confidence: 99%

Section: N-detect Test Minimization By Integer Linear Programming (Ilmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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A Reduced Complexity Algorithm for Minimizing N-Detect Tests

Kantipudi

Agrawal

2007

20th International Conference on VLSI Design Held Jointly With 6th International Conference on Embedded Systems (VLSID'07)

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Diagnostic Test Set Minimization and Full-Response Fault Dictionary

Shukoor

Agrawal

2012

J Electron Test

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We minimize a given test set without loss of diagnostic resolution in full-response fault dictionary. An integer linear program (ILP), formulated from fault simulation data, provides ultimate reduction of test vectors while preserving fault coverage and pairwise distinguishability of faults. The complexity of the ILP is made manageable by two innovations. First, we define a generalized independence relation between pairs of faults to reduce the number of fault pairs that need to be distinguished. This significantly reduces the number of ILP constraints. Second, we propose a two-phase ILP approach. In the first phase, using an existing procedure, we select a minimal detection test set. In the second phase, additional tests are selected for the undiagnosed faults using a newly formulated diagnostic ILP. The overall minimized test set may be only slightly longer than a one-step ILP optimization, but has advantages of reducing the minimization problem complexity and the test time required by the minimized tests. Benchmark results show potential for significantly smaller diagnostic test sets.

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Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift

et al. 2023

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Test sets that target standard fault models may not always be sufficient for detecting all defects. To evaluate test sets for the detection of unmodeled defects, n-detect test sets (which detect all modeled faults at least n times) have previously been proposed. Unfortunately, n-detect test sets are often prohibitively long. In this paper, we investigate the ability of shadow flip-flops connected into a MISR (Multiple Input Signature Register) to detect stuck-at faults fortuitously multiple times during scan shift. We explore which flip-flops should be shadowed to increase the value of n for the least detected stuck-at faults for each circuit studied. We then identify which circuit characteristics are most important for determining the cost of the MISR needed to achieve high values of n. For example, circuits that contain a few flip-flops with upstream fault cones that cover a large percentage of all faults in the circuit can often achieve high n-detect coverage fortuitously with a low-cost MISR. This allows a DFT engineer to predict the viability of this MISR-based approach early in the design cycle.

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On the size and generation of minimal N-detection tests

Cited by 33 publications

References 21 publications

A Reduced Complexity Algorithm for Minimizing N-Detect Tests

A Reduced Complexity Algorithm for Minimizing N-Detect Tests

Diagnostic Test Set Minimization and Full-Response Fault Dictionary

Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift

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