2007
DOI: 10.1016/j.tsf.2007.03.105
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On the structural changes during thermal oxidation of evaporated Zn thin films

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Cited by 27 publications
(11 citation statements)
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“…It can be observed that these values are lower in comparison with those of the unheated Zn films. Such decreasing in the crystallite size in Zn films in consequence of thermal oxidation was also observed in case of Zn films evaporated onto glass substrates [16]. It can be also concluded from Figs.…”
Section: Structural Characteristicssupporting
confidence: 71%
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“…It can be observed that these values are lower in comparison with those of the unheated Zn films. Such decreasing in the crystallite size in Zn films in consequence of thermal oxidation was also observed in case of Zn films evaporated onto glass substrates [16]. It can be also concluded from Figs.…”
Section: Structural Characteristicssupporting
confidence: 71%
“…The lower distance to the film substrate during film deposition and the greater growth rate for sample B can influence the lower crystallite size of sample B. A preferred (0 0 2) orientation of the crystallites was also observed for Zn film normally evaporated onto glass substrates [16], but this is not so strong as in this case. This fact indicates that, in the analyzed case, the intermediary ITO film substrate favors much more the respective texture.…”
Section: Structural Characteristicsmentioning
confidence: 71%
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“…In this case, an underlying oxide layer is formed on the surface of zinc particles before they are melted, leading to formation of structures with a ZnO shell and Zn-rich core. Obtaining of round-shaped ZnO structures by thermal oxidation of polycrystalline Zn thin films using long exposure times has been reported previously [7,23,24].…”
Section: Resultsmentioning
confidence: 85%
“…Indeed, in the case of film deposition, certain crystalline planes may be favored in growth over the other, and therefore, the crystallites may grow with other planes perpendicular 18 or parallel to the substrate. 19 Consequently, other texture orientations of the grains on the film surface may occur. The XRD patterns from Figure 1 can confirm this assumption.…”
Section: Experimental Studiesmentioning
confidence: 99%