2017
DOI: 10.1063/1.4980101
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On the validity of MIS-CELIV for mobility determination in organic thin-film devices

Abstract: The charge extraction (of injected carriers) by linearly increasing voltage in metal-insulator-semiconductor structures, or MIS-CELIV, is based on the theory of space-charge-limited currents. In this work, the validity of MIS-CELIV for mobility determination in organic thin-film devices has been critically examined and clarified by means of drift-diffusion simulations. It is found that depending on the applied transient voltage, the mobility might be overestimated by several orders of magnitude in the case of … Show more

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Cited by 39 publications
(32 citation statements)
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“…Charge carrier mobilities were determined using Resistance‐dependent photovoltage (RPV), [ 29 ] metal–insulator–metal charge extraction by a linearly increasing voltage (MIM‐CELIV) [ 30,31 ] and metal–insulator–semiconductor charge extraction by a linearly increasing voltage (MIS‐CELIV). [ 32,33 ] RPV and MIM‐CELIV were carried out on PM6:Y6 solar cells with inverted device structures (glass/ITO/ZnO/active layer/MoO 3 /Ag). RPV can be used to selectively measure the mobility of the two different photogenerated charge carrier types provided that the mobilities are sufficiently imbalanced, whereas MIM‐CELIV measures the mobility of the more conductive charge carrier.…”
Section: Resultsmentioning
confidence: 99%
“…Charge carrier mobilities were determined using Resistance‐dependent photovoltage (RPV), [ 29 ] metal–insulator–metal charge extraction by a linearly increasing voltage (MIM‐CELIV) [ 30,31 ] and metal–insulator–semiconductor charge extraction by a linearly increasing voltage (MIS‐CELIV). [ 32,33 ] RPV and MIM‐CELIV were carried out on PM6:Y6 solar cells with inverted device structures (glass/ITO/ZnO/active layer/MoO 3 /Ag). RPV can be used to selectively measure the mobility of the two different photogenerated charge carrier types provided that the mobilities are sufficiently imbalanced, whereas MIM‐CELIV measures the mobility of the more conductive charge carrier.…”
Section: Resultsmentioning
confidence: 99%
“…A small charge extraction regime of the MIS-CELIV experiment was used and a typical signal of the transient current is shown in Figure S2. In this regime, the condition Δ j ≤ j ( 0 ) is fulfilled and the monopolar charge carriers are extracted as a uniform sheet of charge [40]. The corresponding small-charge transit time t max for the sheet of carriers to reach the extracting contact defines the mobility as following: μ=2ds2Atmax21+f,where the ratio between the geometric capacitances of the PPQ–DBT semiconductor and the SiO 2 insulator layers f ≡ ( ε s d i )/( ε i d s ) is equal to ~0.3 since dielectric constant is ε i = 3.9 and ε s ≈ 2.5 for SiO 2 and PPQ–DBT, respectively.…”
Section: Methodsmentioning
confidence: 99%
“…Although it is well established that CELIV extracts carrier mobilities, different pitfalls for determining the exact value are known [12,22]. To gain another view on the change in charge-carrier mobility due to dipolar doping, TOF measurements are conducted on four different samples with doping ratios again ranging from 0% to 10%.…”
Section: B Bilayer Mis Structuresmentioning
confidence: 99%