2009
DOI: 10.1016/j.ultramic.2009.03.018
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On-tip sub-micrometer Hall probes for magnetic microscopy prepared by AFM lithography

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Cited by 5 publications
(5 citation statements)
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“…Fabricating the Hall probe on the end of a sharp tip would represent a major breakthrough for the technique as the active area of the Hall sensor can then be readily positioned much closer to the sample surface. AFM/Hall probe microscope hybrids have been fabricated and tested with Bismuth and III-V semiconductors as the active materials [39,109]. However these suffer from high lead resistances and poor stability under ambient conditions.…”
Section: Graphene Hall Probe Magnetic Imaging and Its Applicationsmentioning
confidence: 99%
See 1 more Smart Citation
“…Fabricating the Hall probe on the end of a sharp tip would represent a major breakthrough for the technique as the active area of the Hall sensor can then be readily positioned much closer to the sample surface. AFM/Hall probe microscope hybrids have been fabricated and tested with Bismuth and III-V semiconductors as the active materials [39,109]. However these suffer from high lead resistances and poor stability under ambient conditions.…”
Section: Graphene Hall Probe Magnetic Imaging and Its Applicationsmentioning
confidence: 99%
“…It is also very challenging to fabricate and pattern the Hall probes in this geometry. Following a similar path to Gregusova et al, a graphene/hBN stack can be deterministically transferred onto a truncated tip, followed by Hall probe patterning [109]. However a truncated tip suffers from poorer topographical imaging as compared to a more conical tip shape.…”
Section: Graphene Hall Probe Magnetic Imaging and Its Applicationsmentioning
confidence: 99%
“…Nevertheless, MFM probe working within such a short distance usually causes a non-magnetic tip-sample interaction, thereby yielding unwanted topographic interference. A potential strategy to resolve this issue is to integrate a magneto-resistive sensor [39] or a magnetic field sensor for modern HDDs on the magnetic probe to highly improve the bit resolution [14].…”
Section: Conventional Probe-based Memoriesmentioning
confidence: 99%
“…At this distance, non-magnetic tip-sample interactions become important, leading to undesired topographic cross-talk. A straightforward solution would be to use a Hall sensor integrated on a magnetic tip [108][109][110][111][112] . For better signal-to-noise ratios, integration of a magneto-resistive sensor at the end of the probe, similarly as in hard-disk recording, is preferred.…”
Section: Data Readingmentioning
confidence: 99%