“…Density functional theory (DFT) calculations were performed with the Gaussian 09 program, using the B3LYP functional. All-electron double-ξ valence basis sets with polarization functions 6-31G* were used for all atoms; 1 H NMR and 13 C NMR spectrums were recorded by a Varian Inova 500 NMR spectrometer (Palo Alto, CA, USA) with CDCl 3 as a solvent and tetramethylsilane (TMS) as an internal reference; MALDI-TOF mass spectra were recorded by a Bruker BIFLEXIII (Bremen, Germany); Elemental analysis was performed on a flash EA1112 analyzer; the XRD patterns were recorded using a PANalytical X'Pert 3 powder diffractometer (Almelo, The Netherlands) with Cu Kα radiation (λ = 1.54056 Å); The scanning electron microscopy (SEM) images were taken on a JSM-638OLV scanning electron microscope (Tokyo, Japan) equipped with an energy-dispersive X-ray spectroscopy (EDS) detector (Tokyo, Japan); Film thickness measurement was performed with an AMBIOS Surface Profilomer XP-2 (Santa Cruz, CA, USA); the transmission electron microscopy (TEM) images were obtained with a JEOL Model JEM-2100F (Tokyo, Japan); X-ray photoelectron spectroscopy (XPS) spectra were measured on an ESCALAB 250XI electron spectrometer from Thermo Scientific (Madison, WI, USA) with an AlKα source (photoelectron energy: 1253.6 eV); and the Fourier Transform infrared spectroscopy (FT-IR) was tested in a 400-4000 cm −1 wavenumber using a Nicolet IS10 Fourier Infrared Spectrometer (Madison, WI, USA). When preparing the sample, the composite material was scraped off from the surface of the sample, and after KBr was mixed, the mixture was tableted for testing; Raman spectra were recorded on a Renishaw inVia raman microscope system using Ar + laser (532 nm, 20 mW) for excitation; the photoluminescence spectra with an excitation wavelength of 525 nm were recorded on a F1-4600 (Hitachi) fluorescence spectrophotometer (Tokyo, Japan); diffuse reflectance spectra (DRS) of the film samples were obtained with a UV/VIS/NIR spectrometer (Lambda 750, PerkinElmer, Waltham, MA, USA).…”