2023
DOI: 10.1016/j.corsci.2023.111069
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One-dimensional γ-Al2O3 growth from the oxidation of NiAl

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Cited by 9 publications
(4 citation statements)
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“…Spinel was composed of coarse grains with defects through which surface diffusion of oxygen and nitrogen into the sample could occur. In turn, the formation of Al 2 O 3 reduced the partial pressure of oxygen and impeded spinel formation [34]. A continuous Al 2 O 3 layer was located at the boundary between sublayers I and II, being responsible for the enhancement of oxidation resistance.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Spinel was composed of coarse grains with defects through which surface diffusion of oxygen and nitrogen into the sample could occur. In turn, the formation of Al 2 O 3 reduced the partial pressure of oxygen and impeded spinel formation [34]. A continuous Al 2 O 3 layer was located at the boundary between sublayers I and II, being responsible for the enhancement of oxidation resistance.…”
Section: Resultsmentioning
confidence: 99%
“…In the transitional MeN-Me layer, nitrogen reacted with aluminum to yield AlN nitrides, which also depleted NiAl to Ni 3 Al. Along with Ni 3 Al, the interaction between nitrogen and aluminum contributed to the formation of the MoNi intermetallic phase [34]. In order to assess the effect of thermo-vacuum treatment on high-temperature oxidation resistance, we analyzed the microstructure of the oxidized alloy with composition 2 that had undergone vacuum annealing (Figure 15).…”
Section: Resultsmentioning
confidence: 99%
“…04-0880; Figures 1c and S1). 44 In addition, the Ni (111) grain size of the samples was calculated according to Scherrer's formula (S2), and it can be found that the addition of Al affects the grain size of the xNi-Al 2 O 3 /CN samples. 1).…”
Section: Structural Characterization 311 Effect Of Al Content On Stru...mentioning
confidence: 99%
“…Thereafter, the structures of the newly formed phases on the surface and at the grain boundary were investigated via transmission electron microscopy (TEM 200 kV FEI Tecnai G2 F20). The TEM samples were prepared using a focused ion beam (FIB, ZEISS Crossbeam 540) [20].…”
Section: 2microstructure and Characterisationmentioning
confidence: 99%