“…The XRD pattern of 4.5Ni11Mo–S/CAC exhibited weak characteristic diffraction peaks, which may be attributed to low loading and high dispersion. However, the XRD patterns of 9Ni11Mo–S/CAC and 18Ni11Mo–S/CAC showed obvious characteristic peaks at 21.7°, 31.1°, 37.8°, 38.3°, 49.7°, 50.1°, and 55.3°, corresponding to (101), (110), (003), (021), (113), (211), and (300), which are consistent with the Ni 3 S 2 standard card (JCPDS: 44-1418). ,,, Notably, the intensity of characteristic peaks in the XRD pattern of the reported MoS 2 active centers was weak compared to that observed in this study. , A detailed comparison with the MoS 2 standard card (JCPDS: 17-0744) revealed that the crystal surfaces at 14.5°, 33.0°, 34.1°, 41.1°, 44.5°, 48.1°, and 58.3° corresponded to (003), (101), (012), (015), (009), (107), and (110).…”