Online Built-In Self-Test Architecture for Automated Testing of a Solar Tracking Equipment

Improving the Solar Reliability Factor of a Dual-Axis Solar Tracking System Using Energy-Efficient Testing Solutions

“…The above metrics system is calculated for a number of D = 16 flip-flops (for stuck-atfaults), T P = 840 (for syntax errors), and N R = 1000 (for structural faults). Accordantly, the following results are obtained, presented in Equation ( 18): Secondly, based on the results obtained in the equation set (18), the global SRF parameter is computed, as presented in Equation ( 19):…”

“…The work in [18] presents an OBIST architecture that injects random test patterns from a 16-bit linear feedback shift register (LFSR) into a circuit chain composed of an Optocoupler LTV847, Arduino UNO MCU, and two L298N motor drivers in order to obtain a signature database of fully functional and faulty components. The polynomial function, which in our case is given by the expression P(x) = 1 + x + x 3 + x 12 + x 16 , is an essential element of the BIST architecture since it allows us to control the amount of patterns that are generated, thus maximizing the number of test vectors that can be injected in the CUTs.…”

“…Similarly, for the multiple input signature register (MISR), the same amount of ICs can be used in order to construct two signature databases that are analyzed for error detection, as can be seen in Figure 3. Since the fault coverage obtained in [18] was efficient, no OBIST hardware implementation parts were necessary to be modified. Thus, the unified metrics system can be adapted to the relations from [16], as expressed in the equation set:…”

Increasing the Solar Reliability Factor of a Dual-Axis Solar Tracker Using an Improved Online Built-In Self-Test Architecture

“…Despite the welldefined logic in Table II, altered signal values that may be delivered or generated from the Arduino UNO disrupt the logic of the MCU's firmware and thus cause significant energy loss due to the incorrect placement of the PV panel. Therefore, a more in-depth signal analysis was conducted in [28] by developing an OBIST for single bit-flip and single stuck-atfault detection. Output signals of the Arduino UNO MCU were continuously monitored in real-time with the help of a PC Oscilloscope, according to the waveforms presented in Fig.…”

“…For a more concrete example, let us consider the minimized combinational circuit of the LTV-847 IC in Fig. 3, according to its functionality presented in [28]. A truth table, a deterministic mapping of input values to output values, can represent the function of a combinational logic circuit in an error-free operating system.…”