The main challenge of modern land management is the need to increase the yield of cultivated crops, while maintaining quality, minimising total energy inputs into cultivation and minimising the negative impact on the environment. This is quite possible if we have healthy seeds characterised, first of all, by improved sowing qualities. In order to realise the mentioned approaches, it is possible to use seed preparation for sowing, using for this purpose various electrophysical effects, including treatment of seed material in the electric field of high voltage. The purpose of the presented article is to analyse the results obtained to study the process of treatment of cereal seeds before sowing in the electric field of constant and alternating high voltage, as well as the electric field of pulsed high-voltage discharges. A universal experimental laboratory setup was assembled for the research. According to the results of the experiments, there was a clear dependence of the speed and friendliness of germination of winter triticale and barley seeds on the effects of electrical nature on them. Efficiency of such influences is also shown in plant protection against various pests, so against bread fleas and meromysa it is treatment in the electric field of alternating high voltage with duration of 120 s, as well as against Swedish fly, but with duration of treatment of 60 s; against wheat thrips – in the electric field of constant high voltage with duration of 60 s. Besides optimisation of phytosanitary condition of crops, the stimulating effect of high voltage electric field on yield structure of cereal crops (winter barley and triticale) was revealed, as productivity increases, bushiness and more dense productive stalks are formed. Electrostimulation has a positive effect on such hard-to-regulate parameter as ear fineness – the total number of grains in the ear increases by 13.8…31.0%; the weight of 1000 grains slightly increases – by 3.0…6.2%; grain yield to total weight increases by 40.3…57.8%; positive effect on all elements of yield structure is traced.