1986
DOI: 10.1016/s0065-2539(08)60332-7
|View full text |Cite
|
Sign up to set email alerts
|

Open-Circuit Voltage Decay in Solar Cells

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
5
0

Year Published

1990
1990
2021
2021

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 12 publications
(5 citation statements)
references
References 44 publications
0
5
0
Order By: Relevance
“…The high photovoltage value of Figure 8h demonstrates that hematite photoanode exhibits good PEC performance. Furthermore, the measurement of the OCP decay after the removal of the light source can provide information about the excess carrier lifetime in p-n diodes or solar cells [59,60]. Using the short-term high frequency measurement and the OCP decay method in a long-term time-scale observation, the OCP decay measurement provides information related to the electrode/surface recombination mechanism along with the minority carrier lifetime in Equation 5below [61].…”
Section: Illuminated Open-circuit Potential (Ocp)mentioning
confidence: 99%
“…The high photovoltage value of Figure 8h demonstrates that hematite photoanode exhibits good PEC performance. Furthermore, the measurement of the OCP decay after the removal of the light source can provide information about the excess carrier lifetime in p-n diodes or solar cells [59,60]. Using the short-term high frequency measurement and the OCP decay method in a long-term time-scale observation, the OCP decay measurement provides information related to the electrode/surface recombination mechanism along with the minority carrier lifetime in Equation 5below [61].…”
Section: Illuminated Open-circuit Potential (Ocp)mentioning
confidence: 99%
“…The high and low level injection curves usually show two different slopes [4,11,12,18,19], as illustrated in the Fig. 2. …”
Section: Summary Of the Ocvd Theorymentioning
confidence: 96%
“…The lifetimes measured are slightly higher compared to the ones measured with the forward current induced OCVD. Indeed, this photo induced method gives estimates of the carrier lifetime that are generally longer than those obtained from the forward induced OCVD [12,19].…”
Section: Photo Induced Ocvdmentioning
confidence: 99%
See 1 more Smart Citation
“…That is the case of open-circuit voltage decay (OCVD) in which an excess of charges is injected either by illumination (e.g., in the case of a solar cell) or by the application of a forward bias (both in solar cells and raw materials). [125] To distinguish between the two kinds of voltage decays, they are usually referred as OCVD and ABVD (after-bias voltage decay). Here we will not make such distinction and we will refer to these techniques simply as OCVD.…”
Section: Advanced Structural and Functional Characterization Of Doped Mossmentioning
confidence: 99%