1991
DOI: 10.1109/22.88556
|View full text |Cite
|
Sign up to set email alerts
|

Open resonator for precision dielectric measurements in the 100 GHz band

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
32
0

Year Published

1996
1996
2021
2021

Publication Types

Select...
5
3
1

Relationship

0
9

Authors

Journals

citations
Cited by 83 publications
(32 citation statements)
references
References 11 publications
0
32
0
Order By: Relevance
“…All our dielectric permittivity measurements were performed in the frequency range of 33-35 GHz and under the temperature range −16 ± 1.5°C at the National Institute of Polar Research (NIPR), Japan. The errors associated with sample thickness variations (<0.1 mm) were minimized by solving equations (Jones, 1976;Komiyama, 1991) for multiple resonant frequencies simultaneously, to find a unique solution of dielectric permittivity with a common sample thickness. The final errors in permittivity and dielectric anisotropy Δε (=ε v − ε h ) were ±0.005 and ±0.001 respectively.…”
Section: Methods Of Measurement and Samplesmentioning
confidence: 99%
“…All our dielectric permittivity measurements were performed in the frequency range of 33-35 GHz and under the temperature range −16 ± 1.5°C at the National Institute of Polar Research (NIPR), Japan. The errors associated with sample thickness variations (<0.1 mm) were minimized by solving equations (Jones, 1976;Komiyama, 1991) for multiple resonant frequencies simultaneously, to find a unique solution of dielectric permittivity with a common sample thickness. The final errors in permittivity and dielectric anisotropy Δε (=ε v − ε h ) were ±0.005 and ±0.001 respectively.…”
Section: Methods Of Measurement and Samplesmentioning
confidence: 99%
“…This method enables precise measurement of the dielectric permittivity tensor and the dielectric anisotropy if appropriate sets of frequency and sample thickness are selected to reduce errors [e.g., Jones, 1976;Komiyama et al, 1991]. Ten samples, a to j, were measured, and are described in Table 2.…”
mentioning
confidence: 99%
“…Meanwhile, open cavity is also a power tool for measuring accurately complex permittivity of dielectric materials at millimeter and sub-millimeter wavelengths. How to use this technique to measure the complex permittivity of dielectric material accurately have been investigated in detail [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20]. All of the open cavities investigated are based on spherical mirrors or spherical and planar mirrors.…”
Section: Introductionmentioning
confidence: 99%