We have measured the effect of 445 nm, high power diode laser, directed on
the cathode of a SNICS ion source on the extracted beam currents of Cl-, Br- and I- ion
beams. Beam current enhancement factors up to 9 were observed in Cs-depleted operation mode of the
ion source. The photo-assisted enhancement is shown to scale with the laser power and depend
strongly on the neutral Cs flux into the ion source. The effect of the laser diminishes with
increasing Cs oven temperature. We present a qualitative model, supported by cathode current
measurement, arguing that photoelectron emission and Cs coverage of the cathode surface could
explain the observations.