Optical alignment using the Point Source Microscope

Parks, Robert E.; Kuhn, William P.

doi:10.1117/12.618165

Cited by 22 publications

(8 citation statements)

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“…During the first step, the BFL and the PSF of the collimator were measured using an ESDI interferometer and a Point Source Microscope (PSM) [3] mounted on a long travel rack and pinion linear stage. For this measure, the interferometer was placed with its beam directed to the output port of the collimator (see Fig.…”

Section: Methodsmentioning

confidence: 99%

SITELLE optical design, assembly, and testing

et al. 2014

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Section: Methodsmentioning

confidence: 99%

SITELLE optical design, assembly, and testing

et al. 2014

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“…Initial optical alignment of the integrated system was performed using a point source microscope. 11 Fine optical alignment was performed using interferometric data acquired using a 4D PhaseCam 6000 stabilized Twyman Green interferometer (Fig. 16).…”

Section: Laboratory Testingmentioning

confidence: 99%

Development of a lightweight camera for high altitude platform systems

Rees

Baker

Thomson³

et al. 2020

Opt. Eng.

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We describe the development of a lightweight, high-resolution surveillance camera for deployment on high altitude platform systems. The instrument is designed to operate at an altitude of ∼20 km and has an expected ground resolution of better than 120 mm with an appropriate sensor. While designed specifically for imaging at visible wavelengths, it is shown that the design is capable of diffraction-limited imaging at NIR and SWIR wavelengths up to 2.5 μm. We have combined a range of materials from aluminum and titanium alloys through to carbon fiberreinforced plastic to produce an instrument with structural components that match the thermal expansion of the optical glasses used. The use of these materials has resulted in an instrument that weighs <2 kg, including a sensor package, and is designed to weigh <3 kg once integrated with an enclosure and actuated gimbal. The successful testing of two prototype systems is described, including several design outcomes from the program intended for implementation in advance of flight trials. © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

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“…The first step in the fine alignment of the objective lens is achieved with a custom point source microscope (PSM) on a lens centering station. [21][22][23] Position of a reference point on the PSM CCD sensor is first determined by a retroreflector. The optical axis of the PSM is then aligned with the rotation axis of an air bearing.…”

Section: Fabrication Testing and Alignmentmentioning

confidence: 99%

Optical design and system characterization of an imaging microscope at 121.6 nm

et al. 2018

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We present the optical design and system characterization of an imaging microscope prototype at 121.6 nm. System engineering processes are demonstrated through the construction of a Schwarzschild microscope objective, including tolerance analysis, fabrication, alignment, and testing. Further improvements on the as-built system with a correction phase plate are proposed and analyzed. Finally, the microscope assembly and the imaging properties of the prototype are demonstrated.

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Optical alignment using the Point Source Microscope

Cited by 22 publications

References 0 publications

SITELLE optical design, assembly, and testing

SITELLE optical design, assembly, and testing

Development of a lightweight camera for high altitude platform systems

Optical design and system characterization of an imaging microscope at 121.6 nm

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