2020
DOI: 10.1088/2053-1591/ab6772
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Optical and dielectric properties of electrochemically deposited p-Cu2O films

Abstract: A perfect crystalline phases of cuprous oxide were synthesized using electrochemical method at different duration ( 15, 30 and 60 min). The deposited samples were examined by XRD, SEM, UV-Vis absorption and Mott-Schottky measurements. The effect of the deposition time on the optical and dielectric properties of Cu 2 O was studied in detail. The x-ray diffraction indicated increasing of crystallinity and crystallite size with increasing of deposition time. SEM micrographs exhibited grains with three-faced pyram… Show more

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Cited by 45 publications
(22 citation statements)
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“…The result showed a decrease in the energy band gap of nanofilms as deposition time increases. Similar effects on bandgap due to changes in deposition time using electrodeposition techniques have been reported by Refs 40.…”
supporting
confidence: 83%
“…The result showed a decrease in the energy band gap of nanofilms as deposition time increases. Similar effects on bandgap due to changes in deposition time using electrodeposition techniques have been reported by Refs 40.…”
supporting
confidence: 83%
“…This confirmed the prospect offered in energy bandgap engineering of cobalt doped zinc selenide by altering deposition time. Similar effects on bandgap due to changes in deposition time using electrodeposition techniques have been reported by [44,[47][48][49][50].…”
Section: Wavelength (Nm)supporting
confidence: 72%
“…Transmittance values of the deposited thin films fall between 24.40% and 73.15%. Similar effects on the absorbance of thin film as deposition time increases have been obtained by [44,48]. Figure 6 shows the graph of reflectance against wavelength for cobalt doped zinc selenide thin films deposited at different values of deposition time.…”
Section: Optical Propertiessupporting
confidence: 70%
See 1 more Smart Citation
“…The absorbance spectra show high transparency up to 300 nm for the ITO substrate, and an absorption edge localized between 450 and 500 nm for the Cu 2 O films, which corresponds to the excitonic band gap of Cu 2 O films. The spectra of the Cu 2 O_230 nm, Cu 2 O_140 nm and Cu 2 O_90 nm films display an increase in absorbance as a consequence of the thickness increase, a behavior already observed for films grown with different techniques [ 43 ]. Transmission spectra of ITO/quartz and Cu 2 O thin films are reported in Figure 4 b, while in Figure S3 the transmission of the ITO/quartz annealed at 250 °C is compared to the untreated ITO/quartz substrate.…”
Section: Resultsmentioning
confidence: 71%