2011
DOI: 10.1016/j.tsf.2010.12.132
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Optical and electrical properties of electron-irradiated Cu(In,Ga)Se2 solar cells

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Cited by 10 publications
(10 citation statements)
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“…The X-ray diffraction patterns and surface scanning electron microscope images did not change under proton irradiation (data not shown). Previous reports also showed that PL peak intensities due to deep level defects in CIGS decreased under electron 16) and proton 8) irradiation.…”
Section: Resultsmentioning
confidence: 77%
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“…The X-ray diffraction patterns and surface scanning electron microscope images did not change under proton irradiation (data not shown). Previous reports also showed that PL peak intensities due to deep level defects in CIGS decreased under electron 16) and proton 8) irradiation.…”
Section: Resultsmentioning
confidence: 77%
“…Note that the spectral discontinuities at 0.88 and 1.16 eV are due to Wood's anomaly 21,22) and laser ghosts originating from scattering by the diffraction grating, respectively. The PL peak intensity at 0.94 eV, which may be assigned to the transition from the Cu-interstitial level to the Cu-vacancy level (Cu i -V Cu ), 16,23,24) decreased with increasing irradiation fluence. On the other hand, the relative PL peak intensity of approximately 0.8 eV increased with increasing irradiation fluence.…”
Section: Resultsmentioning
confidence: 99%
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“…Above 1 Â 10 16 cm À2 , the values of V OC , FF, and η decreased. As the transmittance and resistivity of the ZnO and CdS thin films did not change with the fluence up to %10 18 cm À2 , [30,31] this result indicates that the CIGS bulk layer is more prone to degradation than the other layers and/or the depletion layer around the CdS-CIGS interface. At the electron fluence from 1 Â 10 15 to 3 Â 10 15 cm À2 , the CIGS solar cells show not only self-healing properties but also the possibility of power enhancement during long-term space application through an increase in V OC .…”
mentioning
confidence: 91%
“…8,9 Reports on the effects of high energy electron irradiation on PL spectra of Cu(In,Ga)Se 2 can be found in the literature. [10][11][12] However, such reports provide limited information on the physical nature of the defects generated by radiation or on the mechanisms of the extraordinary radiation hardness of CuInSe 2 . The main reason for this is the high level of doping of the materials used for such studies, which were thin polycrystalline films with [Cu]/[InþGa] ratios smaller that unity.…”
Section: Introductionmentioning
confidence: 99%