2014
DOI: 10.1109/jphotov.2013.2287770
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Optical and Electrical Simulation of μc-Si:H Solar Cells: Effect of Substrate Morphology and Crystalline Fraction

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Cited by 10 publications
(12 citation statements)
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“…12 −14 On the other hand, it is also reported that the chemical and crystallographic nature, and the morphology of substrates largely influences the crystalline growth resulting in a different crystalline fraction (X c ) of nc-Si:H. 15,16 X c affects the mobility gap (E μ ) of intrinsic nc-Si:H, which in turn influences the V oc of nc-Si:H solar cells. 16 nc-Si:H consists of amorphous and crystalline mixed phases and each phase has a different absorption coefficient. Therefore, when nc-Si:H films have different X c , they will absorb sunlight quite differently and, as a result, J sc as well as V oc can be different.…”
Section: Introductionmentioning
confidence: 99%
“…12 −14 On the other hand, it is also reported that the chemical and crystallographic nature, and the morphology of substrates largely influences the crystalline growth resulting in a different crystalline fraction (X c ) of nc-Si:H. 15,16 X c affects the mobility gap (E μ ) of intrinsic nc-Si:H, which in turn influences the V oc of nc-Si:H solar cells. 16 nc-Si:H consists of amorphous and crystalline mixed phases and each phase has a different absorption coefficient. Therefore, when nc-Si:H films have different X c , they will absorb sunlight quite differently and, as a result, J sc as well as V oc can be different.…”
Section: Introductionmentioning
confidence: 99%
“…When using R¼26.5, the crystalline fraction (X c ) of nc-Si:H was higher. The nc-Si:H with higher X c has a lower energy band gap [32] and its overall absorption at longer wavelengths is higher. For comparison, a 2-μm thick nc-Si:H 1J reference solar cell made with R ¼26.5 has a V oc , J sc , FF, and η of 0.506 V, 20.87 mA/cm 2 , 0.67 and 7.08%, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Both from the experimental observation shown in Figure 4 and from theoretical considerations [63][64][65], we can identify a minimum crystalline fraction of~20%-30% for p-doped nanocrystalline silicon films, often indicated as percolation threshold, that ensure a structural connection within the nc-Si:H network. Usually, it is inferred by a rapid improvement in transport properties [63], and it can be an indication of the overcome of the incubation zone [65].…”
Section: Nucleation Versus Passivationmentioning
confidence: 95%