2016
DOI: 10.1007/s10853-016-0064-8
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Optical and microstructural characterization of multilayer Pb(Zr0.52Ti0.48)O3 thin films correlating ellipsometry and nanoscopy

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Cited by 3 publications
(2 citation statements)
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“…The experimental configuration used for the Piezo-response Force measurements was described in ref. 33 . The Piezo-response Force Microscopy measurements were performed with a tip voltage of 0 V and at a tip biased voltage of +10 V and −10 V. The PFM results in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The experimental configuration used for the Piezo-response Force measurements was described in ref. 33 . The Piezo-response Force Microscopy measurements were performed with a tip voltage of 0 V and at a tip biased voltage of +10 V and −10 V. The PFM results in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The technique is well known for being non-contact, non-destructive, and noninvasive [7][8][9]. It does not require special sample preparation nor labeling of molecules, in comparison to other detection techniques that require labeling-usually enzymatic or fluorescent such as fluorescence imaging [9][10][11].…”
Section: Microscopicmentioning
confidence: 99%