1998
DOI: 10.1016/s0040-6090(98)01123-7
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Optical and structural properties of low-temperature PECVD ETMS SiOx thin films

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Cited by 17 publications
(6 citation statements)
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“…In contrast to the former, the latter are characterized by columnar growth morphology, and their lower density explains their lower barrier performance. The presence of Ar gas during deposition of PECVD SiO x was reported to lead to denser structures [121]. The density of PECVD SiO x coatings, and therefore their oxygen permeability, was found to be strongly dependent on process conditions such as input power, pressure, and O 2 /precursor ratio, the maximum density being slightly larger than 2.2 g/cm 3 [122].…”
Section: Coating and Interface Defectsmentioning
confidence: 99%
“…In contrast to the former, the latter are characterized by columnar growth morphology, and their lower density explains their lower barrier performance. The presence of Ar gas during deposition of PECVD SiO x was reported to lead to denser structures [121]. The density of PECVD SiO x coatings, and therefore their oxygen permeability, was found to be strongly dependent on process conditions such as input power, pressure, and O 2 /precursor ratio, the maximum density being slightly larger than 2.2 g/cm 3 [122].…”
Section: Coating and Interface Defectsmentioning
confidence: 99%
“…In order to have the refractive index of SiO x as a function of x, we have taken several values from the literature [16] and performed an interpolation by using a polynomial fit. Then, we have applied the two-component Bruggemann formula which gives the effective dielectric constant of the core layer e eff by solving the implicit equation [17]:…”
Section: Article In Pressmentioning
confidence: 99%
“…The bending and stretching vibrations of the Si-O-Si bonds were observed at 810 and 1040-1070 cm −1 , respectively, for the samples seen in figures 5(c) and (d). The peak position at 1070 cm −1 revealed that the SiONWs were close to stoichiometric SiO 2 [12,13]. The absorption peaks proven to be sensitive to hydrocarbon species that bond with silicon atoms were not exhibited.…”
Section: Resultsmentioning
confidence: 97%