The wealth of structural phases seen in the rare-earth disilicate compounds promises an equally rich range of interesting magnetic properties. We report on the crystal growth by the optical floating zone method of members of the rare-earth disilicate family, R 2 Si 2 O 7 (with R = Er, Ho, and Tm). Through a systematic study, we have optimized the growth conditions for Er 2 Si 2 O 7 . We have grown, for the first time using the floating zone method, crystal boules of Ho 2 Si 2 O 7 and Tm 2 Si 2 O 7 compounds. We show that the difficulties encountered in the synthesis of polycrystalline and single crystal samples are due to the similar thermal stability ranges of different rareearth silicate compounds in the temperature−composition phase diagrams of the R-Si-O systems. The addition of a small amount of SiO 2 excess allowed the amount of impurity phases present in the powder samples to be minimized. The phase composition analysis of the powder X-ray diffraction data collected on the as-grown boules revealed that they were of single phase, except in the case of thulium disilicate, which was comprised of two phases. All growths resulted in multigrain boules, from which sizable single crystals could be isolated. The optimum conditions used for the synthesis and crystal growth of polycrystalline and single crystal R 2 Si 2 O 7 materials are reported. Specific heat measurements of erbium and thulium disilicate compounds confirm an antiferromagnetic phase transition below T N = 1.8 K for D-type Er 2 Si 2 O 7 and a Schottky anomaly centered around 3.5 K in C-type Tm 2 Si 2 O 7 , with an upturn in C(T)/T below 1 K suggesting the onset of short-range magnetic correlations. Magnetic susceptibility data of E-type Ho 2 Si 2 O 7 reveals an antiferromagnetic ordering of the Ho spins below T N = 2.3 K.