1999
DOI: 10.1016/s0022-2313(99)00155-6
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Optical characterization of carbon-doped Ga0.47In0.53As

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Cited by 1 publication
(2 citation statements)
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“…It is known that the Ge dopants in InGaP show amphoteric behavior with a compensation ratio of about 0.4. This amphoteric behavior changes the local stoichiometry [7] and causes a high density of dislocations [5]. Hence, the lower energy position and broader linewidth of sample A in comparison with sample B may originate from a poor crystallization due to the amphoteric property of Ge dopants [22].…”
Section: Resultsmentioning
confidence: 99%
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“…It is known that the Ge dopants in InGaP show amphoteric behavior with a compensation ratio of about 0.4. This amphoteric behavior changes the local stoichiometry [7] and causes a high density of dislocations [5]. Hence, the lower energy position and broader linewidth of sample A in comparison with sample B may originate from a poor crystallization due to the amphoteric property of Ge dopants [22].…”
Section: Resultsmentioning
confidence: 99%
“…The group-IV element can occupy either the III site, acting as a donor, or the V site, acting as an acceptor. This phenomenon is referred to as amphoteric behavior [5][6][7][8]. The amphoteric behavior of such dopants limits the further enhancement of high carrier concentrations and this problem has been overcome by co-doping with group-V and group-VI elements [9,10].…”
Section: Introductionmentioning
confidence: 99%