2001
DOI: 10.1002/sia.1128
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Optical characterization techniques for process monitoring

Abstract: The aim of this special issue is to bring to the attention of the surface science community the potential and application of optical techniques. This paper gives an overview of the major optical characterization techniques and the subsequent papers. Where possible, links with other surface science techniques are discussed and the use of optical methods for process monitoring and control is emphasized.  Crown

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