Optical constants and fitted transmittance spectra of varies thickness of polycrystalline ZnSe thin films in terms of spectroscopic ellipsometry

Thickness dependence of structural and optical properties of cadmium iodide thin films

“…The observed increase in refractive index with increasing film thickness may be attributed to the increase in density of the films and the increase in crystallite size. The increase in refractive index with increasing film thickness is in a good agreement with the previously reported results [8,14,26,27] …”

“…The growth of crystallize size and its distribution, as stated, depends on film thickness and deposition rate. Many publications have been determined both refractive index and thickness of thin films by measuring reflectance and transmittance using spectrophotometer [7][8][9][10][11] and measuring psi and delta using spectroscopic ellipsometry [12][13][14]. Both of which were a powerful techniques to investigate the optical response of materials.…”

Investigation of atmospheric insect wing-beat frequencies and iridescence features using a multispectral kHz remote detection system

“…Generally, this remote detection system has shown potential for future studies of insect activities and we can say that wing-beat frequency, absolute OCS, spectral signature, and iridescence features could provide a means to remotely identify insects. In the future, we plan to investigate this farther using the concepts of thin films [44][45][46][47][48][49][50] to estimate the membrane thickness of insect wings. …”

Optical characterization of polycrystalline ZnSe1−xTex thin films using variable angle spectroscopic ellipsometry and spectrophotmetery techniques

“…The spectral dependencies of ψ and Δ were fitted using the appropriate model to extract the film thickness and optical constants, i.e., refractive index (n) and extinction coefficient (k), using a least squares regression analysis and a weighted root mean square error function. The optical constants of ZnSe 1 À x Te x are accurately described with a three-layer model: upper layer (rough layer)/ "B-Spline" absorbing ZnSe 1 À x Te x layer/ glass substrate [10,28,29]. The B-Spline layer is perfect for materials that are partially transparent and partially absorbing.…”

“…The optical constants (n, k) and thickness of ZnSe x Te 1 À x thin films have been obtained in litratures from reflectance (T) and transmittance (R) measurements using the spectrophotometery technique [7][8][9][10][11][12][13] and from psi (ψ) and delta (Δ) using the spectroscopic ellipsometry (SE) technique [14][15][16][17][18][19]. These methods represent powerful techniques to investigate the optical response of materials.…”