Optical diagnostics for plasma physics and accelerator science: commonalities and differences

Abstract

Optical diagnostics are widely used both for experiments of plasma physics and for measurements of parameters of electron/positron beams in accelerators. The approaches applied for these often have the same methodological basis explained by the similarity of the properties of the studied phenomena. Nevertheless, these branches of physics are very specific and require special diagnostics. The possibility of closed contacts and cooperation between scientists solving similar problems in different areas of physics helps to overcome these problems. It is especially typical for BINP SB RAS known by pioneering works on electronpositron colliders and nuclear fusion. This paper describes the diagnostics that are used in plasma physics experiments, especially for plasma heating by a high-current electron beam, and contains a comparison with optical diagnostics which are recognized tools in colliders and storage rings.

Development and application of electron beam optical diagnostics for the multi-turn ERL of the Novosibirsk FEL facility

“…Optical diagnostics is widely used around the world due to its efficiency, non-destructive character, and precise direct measurements of electron beam. It is also important that this type of diagnostics is used on the other machines at Budker INP [11][12][13]. Nonetheless, the integration of this measurement complex into NovoFEL demands taking account of the specific ERL parameters.…”

A new station for optical observation of electron beam parameters at electron storage ring SIBERIA-2

“…Moderateamplitude oscillations cause appearance of "spikes" in the dissector signal, as presented in figure 9. The further growth of the amplitude of the oscillations transforms the dissector signal to spiked split "humps", which have nothing to do with the true longitudinal beam profile [14]. On the other hand, the Fourier transform of the dissector signal enables us to determine the synchrotron frequency (figure 13).…”

“…There is a compromise solution of recording every fifth bunch with a possibility of selecting a specific sequence of bunches (a 16-channel 50 MHz ADC with serial outputs is used). Any sequence can be chosen via configuring the synchronization unit (figure 13,14).…”