This work, results on the Annealing effects, optical and structural study of Zn x /Te 1--x thin films of 200 nm obtained by the vacuum evaporation technique. The layers are grown and then annealed for various temperatures and characterized by XRD, SEM and photo absorbance studies. Band gap of ~2.1eV has obtained by optical measurements. SEM micrographs clearly indicate cluster growth at the surface of a thin film of Zn 50 :Te 50 composition. However no prominent cluster growth has been observed at other stoichiometry ratios.