Encyclopedia of Analytical Chemistry 2016
DOI: 10.1002/9780470027318.a0848.pub3
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Optical Emission Inductively Coupled Plasma in Environmental Analysis

Abstract: The ability of the ICP‐OES (inductively coupled plasma‐optical emission spectroscopy) (or AES, atomic emission spectroscopy) system to perform multielement trace metal analysis of environmental samples provided commercial laboratories with the needed incentive to enter into the business of efficient trace metal analysis. Previously, trace metals were typically analyzed using colorimetric techniques, which were both cumbersome and subject to interferences, or flame atomic absorption techniques, which although a… Show more

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Cited by 4 publications
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“…The accuracy of the ICP‐OES analytical protocol was evaluated via analysis of certified reference standard materials (Tatro & Amarasiriwardena, 2016 ).…”
Section: Methodsmentioning
confidence: 99%
“…The accuracy of the ICP‐OES analytical protocol was evaluated via analysis of certified reference standard materials (Tatro & Amarasiriwardena, 2016 ).…”
Section: Methodsmentioning
confidence: 99%
“…Sample aliquots were taken from the main reservoirs (Figure ) before beginning each experiment and were stored at 4 °C prior to analytical analysis, which was used to determine the ionic concentrations of constituent ions of each electrolyte used in the experiments. All aliquots were analyzed using ion chromatography (Eith et al, ; Jackson, ), titration for carbonate and bicarbonate analysis (Franson, ), and inductively coupled plasma atomic emission spectroscopy (Tatro & Amarasiriwardena, ) for silica, strontium, and barium. The average ionic composition of the groundwater and seawater are shown in SI Text S2.…”
Section: Methodsmentioning
confidence: 99%
“…Известно, что использование аксиального (осевого) способа наблюдения плазмы (обзора) позволяет повысить чувствительность благодаря увеличению проецируемой на входную щель спектрометра области излучения атомов [7]. Наряду с повышением чувствительности существуют некоторые недостатки использования аксиального обзора, связанные со спектральными наложениями и матричными влияниями [8,9].…”
Section: Introductionunclassified