2009
DOI: 10.1007/s11141-009-9103-5
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Optical interference methods of subwavelength-resolution imaging

Abstract: We present two novel optical interference methods for measuring characteristics of surfaces with subwavelength resolution. One method is based on recording interferograms of the light near field which comprises information on the subwavelength structure of the surface. The idea of the other method is to transform the near field to propagated waves and measure their parameters far from the studied surface. The proposed methods have been tested by numerical simulation.

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Cited by 11 publications
(2 citation statements)
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“…Measurements were based on the phase-shift interferometry method proposed in Ref. [27]. Optical scheme was the same as in Refs.…”
Section: Thermal Lens Measurementmentioning
confidence: 99%
“…Measurements were based on the phase-shift interferometry method proposed in Ref. [27]. Optical scheme was the same as in Refs.…”
Section: Thermal Lens Measurementmentioning
confidence: 99%
“…The phase-shift interferometric method described in detail in [12] was used to measure the optical strength of a thermal lens. The sample was placed in one of the arms of the Michelson interferometer and heated by the radiation of a fiber ytterbium laser (λ=1,07 um) with a beam radius of 1.7 mm, the beam profile was close to Gaussian.…”
Section: Thermal Lensmentioning
confidence: 99%