Optical properties of various MOVPE grown structures containing InAs δ-layers in GaAs were investigated by photoluminescence, photocurrent and photomodulated reflectance spectroscopy. Observed ground and high-order interband transitions were interpreted by simulation of electronic states in InAs δ-layers using the theoretical model accounting for influence of stress and quantum states coupling. It is shown, that material parameters crucial for optimization and growth control of InAs δ-layers structures, such as equivalent layer thicknesses/compositions, can be extracted from obtained optical data.