Optical loss mechanism in yttria thin film waveguides

Kim, You Song; Kim, Weon Hyo

doi:10.1016/s0925-3467(99)00142-1

Cited by 20 publications

(5 citation statements)

References 7 publications

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“…Significant research in the growth and characterization of both Gd 2 O 3 and Y 2 O 3 has been undertaken over the past few years because of their several relevant physical properties and technical applications such as: high melting point [1]; high mechanical strength [2]; high dielectric constant (in the range [14][15][16][17][18] [3]; a rather high refractive index n ≅ 2 [4]; and a very good protective behavior as a coating in reactive severe environment [5]. Both are promising materials for electronic applications to replace SiO 2 in metal-oxide-semiconductor (MOS) heterostructures used in the MOS transistor [6].…”

Section: Introductionmentioning

confidence: 99%

“…In addition, pure and doped Gd 2 O 3 films have been studied as catalyst for dimerization of many organic compounds [7], phosphor films [8,9], scintillating films [10] and to passivate III-V compound semiconductors [11]. As optical waveguides, Y 2 O 3 films is a promising candidate of low propagation loss [12][13][14]. Mixing these oxides enhances their advantages by upgrading their properties and adding new ones.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

X‐ray diffraction analysis of powder and thin film of (Gd_1‐xY_x)₂O₃ prepared by sol‐gel process

Arda

2008

Cryst. Res. Technol.

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The mixed oxide (Gd 1-x Y x ) 2 O 3 (0.0 ≤ x ≤ 1.0) were synthesized, as powder and thin film, by a sol-gel process. X-ray diffraction data were collected and crystal structure and microstructure analysis were performed using Rietveld refinement method. All samples were found to have the same crystal system and formed solid solutions over the whole range of x. The cationic distribution, Gd 3+ and Y 3+, over the two non-equivalent sites 8b and 24d of the space group Ia3 is found to be random for all values of (x). The lattice parameter is found to vary linearly with the composition (x). Replacing Gd 3+ and Y 3+ by each other introduces a systemic decrease in the x-coordinate of cation position (24d) and slight changes in the oxygen coordinates. Crystallite size and microstrain analysis is performed along different crystallographic directions and anisotropic changes are found with the composition parameter (x). The average crystallite size ranges from 75 to 149 nm and the r.m.s strain from 0.027 to 0.068 x10 . Textured Gd 1.841 Y 0.159 O 3 (400) buffer layers, with a high degree of alignment in both out-plane and in-plan, are successfully grown on cube textured Ni (001) tape substrates by sol-gel dip coating process. The resulting buffer layers are crack-free, pinhole-free, dense and smooth. YbBa 2 Cu 3 O 7-x (YbBCO) thin film could be (00l) epitaxially grown on the obtained buffer layer using sol-gel dipping technique.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

X‐ray diffraction analysis of powder and thin film of (Gd_1‐xY_x)₂O₃ prepared by sol‐gel process

Arda

2008

Cryst. Res. Technol.

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“…Losses in thin waveguide layers originate from many factors 37 , which include absorption in the core, leakage between the core and the cladding and scattering losses. One of the key contributors to scattering loss are the sizeable grain boundaries between neighboring crystal domains, which lead to strong Rayleigh scattering of confined light out of the waveguide.…”

Section: Characterization Results and Discussionmentioning

confidence: 99%

Structural and optical properties of different dielectric thin films for planar waveguiding applications

et al. 2011

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Thin films of two different dielectric materials (Yttrium Oxide and Tantalum Pentoxide) were deposited by reactive sputtering and reactive evaporation to determine their suitability as a host for a rare earth doped planar waveguide upconversion laser. The optical properties, structure and crystalline phase of the films were found to be dependent on the deposition method and process parameters. X-ray diffraction (XRD) analysis on several of the 'as-deposited' thin films revealed that the films vary from amorphous to highly crystalline depending on material and process parameters . SEM imaging of the Yttrium Oxide layers revealed a regular column structure confirming their crystalline nature and SEM imaging of the Tantalum Pentoxide layers revealed a smooth amorphous layer confirming their XRD diffractrograms. The dielectric thin film layers which allowed guiding in both the visible and infra-red regions of the spectrum had a more amorphous structure.

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“…One of the important characteristics of any waveguiding layer is its propagation loss. Losses in thin waveguide layers originate from many factors 26 , which include absorption in the core, leakage between the core and the cladding and scattering losses. One of the key contributors to scattering loss are the sizeable grain boundaries between neighboring crystal domains, which lead to strong Rayleigh scattering of confined light out of the waveguide.…”

Section: Characterization Results and Discussionmentioning

confidence: 99%

Structural and optical properties of yttrium oxide thin films for planar waveguiding applications

Pearce

Parker

Charlton

et al. 2010

Journal of Vacuum Science &Amp; Technology A: Vacuum, Surfaces, and Films

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Thin films of yttrium oxide, Y2O3, were deposited by reactive sputtering and reactive evaporation to determine their suitability as a host for a rare earth doped planar waveguide upconversion laser. The optical properties, structure, and crystalline phase of the films were found to be dependent on the deposition method and process parameters. X-ray diffraction analysis on the “as-deposited” thin films revealed that the films vary from amorphous to highly crystalline with a small broad peak at 29° corresponding to the ⟨222⟩ reflections of Y2O3. The samples with the polycrystalline structure had a stoichiometry close to bulk cubic Y2O3. Scanning electron microscopy imaging revealed a regular column structure confirming their crystalline nature. The thin film layers which allowed guiding in both visible and infrared regions had lower refractive indices, higher oxygen content, and a more amorphous structure. Higher oxygen pressures during the deposition lead to a more amorphous layer.

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Optical loss mechanism in yttria thin film waveguides

Cited by 20 publications

References 7 publications

X‐ray diffraction analysis of powder and thin film of (Gd_1‐xY_x)₂O₃ prepared by sol‐gel process

X‐ray diffraction analysis of powder and thin film of (Gd_1‐xY_x)₂O₃ prepared by sol‐gel process

Structural and optical properties of different dielectric thin films for planar waveguiding applications

Structural and optical properties of yttrium oxide thin films for planar waveguiding applications

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Optical loss mechanism in yttria thin film waveguides

Cited by 20 publications

References 7 publications

X‐ray diffraction analysis of powder and thin film of (Gd1‐xYx)2O3 prepared by sol‐gel process

X‐ray diffraction analysis of powder and thin film of (Gd1‐xYx)2O3 prepared by sol‐gel process

Structural and optical properties of different dielectric thin films for planar waveguiding applications

Structural and optical properties of yttrium oxide thin films for planar waveguiding applications

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Product

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X‐ray diffraction analysis of powder and thin film of (Gd_1‐xY_x)₂O₃ prepared by sol‐gel process

X‐ray diffraction analysis of powder and thin film of (Gd_1‐xY_x)₂O₃ prepared by sol‐gel process