Optical measure of disorder: Why Urbach analysis works for amorphous silicon but fails for amorphous carbon

Indium-zinc-oxide thin films produced by low-cost chemical solution deposition: Tuning the microstructure, optical and electrical properties with the processing conditions

“…9 b. In the TLU dispersion, the exponential Urbach tail overtakes the Lorentz oscillator at E < E t , in which region the parameter E u defines the decay energy related to the widening of the joint density of states, often related to the structural “disorder” or the presence of defects in the electronic structure [ 33 , 49 , 50 ]. In the case of IZO6, the fitted value of E u is relatively large, compared to the values obtained for lightly In-doped ZnO magnetron-sputtered films with a high level of crystallinity [ 17 ].…”

Ceramics, Glass and Glass-Ceramics for Personal Radiation Detectors

“…Moreover, the changes in the glow curve shape can be used to deduce the damage created by the high radiation to the thermoluminescent material [26]. The extent of disordering in glass network can be deduced from Urbach energy (Urbach tail) which described the localized states present in the bandgap [27]. During irradiation, atoms are ionized as the bound electrons interact with high energy particles.…”