2016 IEEE 14th International Conference on Industrial Informatics (INDIN) 2016
DOI: 10.1109/indin.2016.7819227
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Optical methods for the analysis of residual stresses and measurement of displacements in the nanometric range

Giancarlo Pedrini
1
,
V. Martínez-García
2
,
P. Weidmann
3
et al.
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